Sage 150 Compact ESCA System Sage 300 Modular 12" ESCA Wafer Inspection System SAGE HD Storage Media Inspection System

INA X Ion and Secondary Neutral Mass Spectrometer Analysis System

UHV Surface Analysis Systems (Customized UHV systems for XPS, UPS, Auger, LEED, EELS, SIMS, STM and materials deposition)

Delta 0.5 HREELS (Delta 0.5) Ultimate Resolution Electron Energy Loss Spectrometer