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El-Sol Technologies Ltd.
P.O.Box 2699, Natanya 42126
ISRAEL
Tel: +972 4 624 70 33
Fax: +972 4 624 70 23

e-mail: elsolab@actcom.co.il

 


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The UHV Analytical Systems

are ultra high vacuum systems with analytical spectrometers for surface analysis,
i.e. XPS, UPS, Auger, LEED, EELS, SIMS, STM and materials deposition

MBE & XPS system

PHOIBOS UHV System

XPS systems
SAT-SPECS system
UHV Deposition system


 

Add-on components facilitate the expansion to a multipurpose analytical system (XPS, UPS, AES, MXPS, SEM/SAM, ISS and SIMS/SNMS. These electron and ion spectroscopic techniques, in particular XPS, offer the possibility to obtain qualitative and quantitative elemental and chemical information from surface layers and interfaces, providing a powerful analysis combination for a wide range of materials and for your own special needs.

We can provide you an equipment on your request. Different types of energy analyzers, as well as preparation chambers, high pressure cell, manipulators, monochromator and add-on components choosen by customer facilitate the expansion to a powerful multipurpose surface analytical system.

The Data Acquisition and the System Control Soft/Hardware supports the system at different integration levels.
The UHV system links either to the SPECTRAŽ data acquisition system or to SPECS new SpecsLab acquisition package based on a UNIX or NT operating system.


The main features of our UHV system are: 
  • modular design
  • multimethod capability:
    XPS, AES, MXPS, SEM/SAM, UPS, ISS, SIMS/SNMS, LEED, EELS, MBE
    can be incorporated 
  • versatile sample preparation chamber (optional)
  • high pressure preparation chamber (optional)
  • sample manipulator and sample load lock introduction

 

To obtain further information, please contact us at elsolab@actcom.co.il.


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| SURFACE ANALYSES => SYSTEMS => UHV |