Features:
- Detection Limit down to 1 ppm
- Simple Quantification of Sample Composition
- High Depth Resolution in the nm regime (<1
nm)
- Analysis of conducting and insulating Materials
- Sample Transfer and Storage Facility
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Applications:
- Quantitative Depth Profile Analysis
- Impurity and Contamination Analysis in Quality
Control
- Rapid Routine Depth Profiling for Industrial
Applications
- Analysis of buried Interfaces
Environmental
Analysis |
